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    A 3D Contact Surface Pro ler Inspired from Atomic Force Microscopy
    Byungki Kim, Woocheol Shin, Jinseok Kim, Hyunbong KimJournal of Advanced Technology Research, Vol. 2, No. 2, pp. 21-25, Dec. 2017
    10.11111/JATR.2017.2.2.0021
    Keywords: Atomic Force Microscopy, Contact Pro ler, 3D Measurement