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원자현미경을 모사한 3차원 접촉식 표면 측정기
김병기, 신우철, 김진석, 김현봉Journal of Advanced Technology Research,
Vol. 2, No. 2, pp. 21-25,
12월.
2017
10.11111/JATR.2017.2.2.0021
Keywords: Atomic Force Microscopy, Contact Pro ler, 3D Measurement
10.11111/JATR.2017.2.2.0021
Keywords: Atomic Force Microscopy, Contact Pro ler, 3D Measurement
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